X. Baie

	2001
1		Xiaohui Tang, X. Baie, J. P. Colinge, P. Loumaye, C. Renaux, Vincent Bayot: Influence of device geometry on SOI single-hole transistor characteristics. Microelectronics Reliability 41(11): 1841-1846 (2001)

Coauthor Index

1	Vincent Bayot	[1]
2	J. P. Colinge	[1]
3	P. Loumaye	[1]
4	C. Renaux	[1]
5	Xiaohui Tang	[1]

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