Swapnil Bahl

	2012
7		Erik Jan Marinissen, Gilbert Vandling, Sandeep Kumar Goel, Friedrich Hapke, Jason Rivers, Nikolaus Mittermaier, Swapnil Bahl: EDA solutions to new-defect detection in advanced process technologies. DATE 2012: 123-128
	2011
6		Shray Khullar, Swapnil Bahl: Power Aware Shift and Capture ATPG Methodology for Low Power Designs. Asian Test Symposium 2011: 500-505
5		Swapnil Bahl, Roberto Mattiuzzo, Shray Khullar, Akhil Garg, S. Graniello, Khader S. Abdel-Hafez, Salvatore Talluto: State of the art low capture power methodology. ITC 2011: 1-10
	2008
4		Swapnil Bahl, Vishal Srivastava: Self-Programmable Shared BIST for Testing Multiple Memories. European Test Symposium 2008: 91-96
3		Swapnil Bahl, Rajiv Sarkar, Akhil Garg: Low Power Test. ITC 2008: 1
	2007
2		Swapnil Bahl: A Sharable Built-in Self-Repair for Semiconductor Memories with 2-D Redundancy Schema. DFT 2007: 331-339
	2004
1		Swapnil Bahl: A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller. MTDT 2004: 78-83

Coauthor Index

1	Khader S. Abdel-Hafez	[5]
2	Akhil Garg	[3] [5]
3	Sandeep Kumar Goel	[7]
4	S. Graniello	[5]
5	Friedrich Hapke	[7]
6	Shray Khullar	[5] [6]
7	Erik Jan Marinissen	[7]
8	Roberto Mattiuzzo	[5]
9	Nikolaus Mittermaier	[7]
10	Jason Rivers	[7]
11	Rajiv Sarkar	[3]
12	Vishal Srivastava	[4]
13	Salvatore Talluto	[5]
14	Gilbert Vandling	[7]

Colors in the list of coauthors

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