Ameet Bagwe

	2000
2		Ameet Bagwe, Rubin A. Parekhji: Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. Asian Test Symposium 2000: 260-
1		Jais Abraham, Narayan Prasad, Srinivasa Chakravarthy B. S., Ameet Bagwe, Rubin A. Parekhji: A framework to evaluate test tradeoffs in embedded core based systems-case study on TI's TMS320C27xx. ITC 2000: 417-425

Coauthor Index

1	Jais Abraham	[1]
2	Rubin A. Parekhji	[1] [2]
3	Narayan Prasad	[1]
4	Srinivasa Chakravarthy B. S.	[1]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page