Asmik Bagramian

	1999
1		W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel: Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM Journal of Research and Development 43(3): 407-416 (1999)

Coauthor Index

1	W. W. (Bill) Abadeer	[1]
2	David W. Conkle	[1]
3	Charles W. Griffin	[1]
4	Eric Langlois	[1]
5	Brian F. Lloyd	[1]
6	Raymond P. Mallette	[1]
7	James E. Massucco	[1]
8	Jonathan M. McKenna	[1]
9	Steven W. Mittl	[1]
10	Philip H. Noel	[1]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page