M. Bagatin

	2012
4		M. Bagatin, Simone Gerardin, Alessandro Paccagnella, C. Andreani, G. Gorini, C. D. Frost: Temperature dependence of neutron-induced soft errors in SRAMs. Microelectronics Reliability 52(1): 289-293 (2012)
	2010
3		M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen: Destructive events in NAND Flash memories irradiated with heavy ions. Microelectronics Reliability 50(9-11): 1832-1836 (2010)
2		Simone Gerardin, M. Bagatin, Alessandro Paccagnella, G. Cellere, A. Visconti, M. Bonanomi: Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectronics Reliability 50(9-11): 1837-1841 (2010)
	2007
1		M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, A. Visconti, S. Beltrami, M. Maccarrone: Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151

Coauthor Index

1	C. Andreani	[4]
2	S. Beltrami	[1]
3	M. Bonanomi	[2]
4	G. Cellere	[1] [2] [3]
5	C. D. Frost	[4]
6	Simone Gerardin	[1] [2] [3] [4]
7	G. Gorini	[4]
8	F. Irom	[3]
9	M. Maccarrone	[1]
10	D. N. Nguyen	[3]
11	Alessandro Paccagnella	[1] [2] [3] [4]
12	A. Visconti	[1] [2]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page