M. Bafleur

	2010
12		J. Bourgeat, Christophe Entringer, Philippe Galy, M. Bafleur, D. Marin-Cudraz: Evaluation of the ESD performance of local protections based on SCR or bi-SCR with dynamic or static trigger circuit in 32 nm. Microelectronics Reliability 50(9-11): 1379-1382 (2010)
	2009
11		M. Diatta, E. Bouyssou, D. Trémouilles, P. Martinez, F. Roqueta, O. Ory, M. Bafleur: Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD). Microelectronics Reliability 49(9-11): 1103-1106 (2009)
	2008
10		Jinyu Ruan, G. J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, M. Bafleur, Fabio Coccetti, Robert Plana: ESD failure signature in capacitive RF MEMS switches. Microelectronics Reliability 48(8-9): 1237-1240 (2008)
	2007
9		A. Crosson, L. Escotte, M. Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, G. Perez: Long-term reliability of silicon bipolar transistors subjected to low constraints. Microelectronics Reliability 47(9-11): 1590-1594 (2007)
8		Jinyu Ruan, Nicolas Nolhier, M. Bafleur, L. Bary, Fabio Coccetti, T. Lisec, Robert Plana: Electrostatic discharge failure analysis of capacitive RF MEMS switches. Microelectronics Reliability 47(9-11): 1818-1822 (2007)
	2006
7		C. Lochot, J. P. Lainé, M. Bafleur, A. Cazarré, J. Tasselli: Potentialities of substrate-thinning technique to control minority carrier injection in smart power IC's. Microelectronics Journal 37(8): 804-811 (2006)
6		F. Essely, F. Darracq, Vincent Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, André Touboul, Dean Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
	2005
5		N. Guitard, F. Essely, D. Trémouilles, M. Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
	2003
4		D. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères: TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectronics Reliability 43(1): 71-79 (2003)
3		T. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
2		M. Zecri, P. Besse, P. Givelin, M. Nayrolles, M. Bafleur, Nicolas Nolhier: Determination of the ESD Failure Cause Through its Signature. Microelectronics Reliability 43(9-11): 1551-1556 (2003)
	2001
1		Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, Dean Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)

Coauthor Index

1	L. Bary	[8]
2	T. Beauchêne	[3]
3	Felix Beaudoin	[1] [3] [4] [6]
4	G. Bertrand	[4]
5	P. Besse	[2]
6	J. Bourgeat	[12]
7	E. Bouyssou	[11]
8	A. Cazarré	[7]
9	Fabio Coccetti	[8] [10]
10	L. Crétinon	[9]
11	A. Crosson	[9]
12	F. Darracq	[6]
13	Romain Desplats	[1] [3]
14	M. Diatta	[11]
15	Christophe Entringer	[12]
16	L. Escotte	[9]
17	F. Essely	[5] [6]
18	Pascal Fouillat	[3]
19	Philippe Galy	[12]
20	P. Givelin	[2]
21	N. Guitard	[4] [5] [6]
22	J. P. Lainé	[7]
23	L. Lescouzères	[4]
24	Dean Lewis	[1] [3] [5] [6]
25	T. Lisec	[8]
26	C. Lochot	[7]
27	D. Marin-Cudraz	[12]
28	P. Martinez	[11]
29	Nicolas Mauran	[10]
30	M. Nayrolles	[2]
31	Nicolas Nolhier	[2] [5] [8] [10]
32	O. Ory	[11]
33	G. J. Papaioannou	[10]
34	Philippe Perdu	[1] [3] [4] [5] [6] [9]
35	G. Perez	[9]
36	Robert Plana	[8] [10]
37	P. Poirier	[1]
38	Vincent Pouget	[3] [5] [6]
39	M. Remmach	[6]
40	F. Roqueta	[11]
41	Jinyu Ruan	[8] [10]
42	D. Talbourdet	[9]
43	J. Tasselli	[7]
44	André Touboul	[5] [6]
45	D. Trémouilles (David Trémouilles)	[1] [3] [4] [5] [11]
46	M. Zecri	[2]

Colors in the list of coauthors

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page