J. Badoc

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2005

1 Yannick Rey-Tauriac, J. Badoc, B. Reynard, R. A. Bianchi, D. Lachenal, A. Bravaix: Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology. Microelectronics Reliability 45(9-11): 1349-1354 (2005)

	2005
1		Yannick Rey-Tauriac, J. Badoc, B. Reynard, R. A. Bianchi, D. Lachenal, A. Bravaix: Hot-carrier reliability of 20V MOS transistors in 0.13 mum CMOS technology. Microelectronics Reliability 45(9-11): 1349-1354 (2005)

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