G. Badenes

	2001
2		M. Da Rold, Eddy Simoen, Sofie Mertens, Marc Schaekers, G. Badenes, Stefaan Decoutere: Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. Microelectronics Reliability 41(12): 1933-1938 (2001)
1		Kai F. Dombrowski, B. Dietrich, Ingrid De Wolf, R. Rooyackers, G. Badenes: Investigation of stress in shallow trench isolation using UV micro-Raman spectroscopy. Microelectronics Reliability 41(4): 511-515 (2001)

Coauthor Index

1	Stefaan Decoutere	[2]
2	B. Dietrich	[1]
3	Kai F. Dombrowski	[1]
4	Sofie Mertens	[2]
5	M. Da Rold	[2]
6	R. Rooyackers	[1]
7	Marc Schaekers	[2]
8	Eddy Simoen	[2]
9	Ingrid De Wolf	[1]

Colors in the list of coauthors

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