Frank Böhland

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1994

2 Arno Kunzmann, Frank Böhland: Gate-Delay Fault Test with Conventional Scan-Design. EDAC-ETC-EUROASIC 1994: 524-528

1 Arno Kunzmann, Frank Böhland: Self-test of sequential circuits with deterministic test pattern sequences. J. Electronic Testing 5(2-3): 307-312 (1994)

	1994
2		Arno Kunzmann, Frank Böhland: Gate-Delay Fault Test with Conventional Scan-Design. EDAC-ETC-EUROASIC 1994: 524-528
1		Arno Kunzmann, Frank Böhland: Self-test of sequential circuits with deterministic test pattern sequences. J. Electronic Testing 5(2-3): 307-312 (1994)

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