S. Bécu

	2005
1		E. Deloffre, L. Montès, G. Ghibaudo, S. Bruyère, S. Blonkowski, S. Bécu, M. Gros-Jean, S. Crémer: Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. Microelectronics Reliability 45(5-6): 925-928 (2005)

Coauthor Index

1	S. Blonkowski	[1]
2	S. Bruyère	[1]
3	S. Crémer	[1]
4	E. Deloffre	[1]
5	Gérard Ghibaudo (G. Ghibaudo)	[1]
6	M. Gros-Jean	[1]
7	L. Montès	[1]

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