L. Béchou

Laurent Béchou

	2010
11		Daniel T. Cassidy, Chadwick K. Hall, Othman Rehioui, Laurent Béchou: Strain estimation in III-V materials by analysis of the degree of polarization of luminescence. Microelectronics Reliability 50(4): 462-466 (2010)
10		R. Baillot, Y. Deshayes, L. Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Y. Ousten: Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses. Microelectronics Reliability 50(9-11): 1568-1573 (2010)
	2008
9		M. L. Bourqui, L. Béchou, Olivier Gilard, Y. Deshayes, P. Del Vecchio, L. S. How, F. Rosala, Y. Ousten, André Touboul: Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectronics Reliability 48(8-9): 1202-1207 (2008)
8		Y. Deshayes, I. Bord, G. Barreau, M. Aiche, P. H. Moretto, L. Béchou, A. C. Roehrig, Y. Ousten: Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation. Microelectronics Reliability 48(8-9): 1354-1360 (2008)
	2005
7		S. Huyghe, L. Béchou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, J. L. Goudard, Y. Danto: Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectronics Reliability 45(9-11): 1593-1599 (2005)
	2003
6		Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano: An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE T. Instrumentation and Measurement 52(1): 135-142 (2003)
5		Y. Deshayes, L. Béchou, J.-Y. Delétage, F. Verdier, Y. Danto, D. Laffitte, J. L. Goudard: Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules. Microelectronics Reliability 43(7): 1125-1136 (2003)
4		J.-Y. Delétage, F. J.-M. Verdier, B. Plano, Y. Deshayes, L. Béchou, Y. Danto: Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectronics Reliability 43(7): 1137-1144 (2003)
3		L. Mendizabal, Jean-Louis Verneuil, L. Béchou, Christelle Aupetit-Berthelemot, Y. Deshayes, F. Verdier, Jean-Michel Dumas, Y. Danto, D. Laffitte, J. L. Goudard: Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator. Microelectronics Reliability 43(9-11): 1743-1749 (2003)
	2002
2		B. Trégon, Y. Ousten, Y. Danto, L. Béchou, B. Parmentier: Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectronics Reliability 42(7): 1113-1120 (2002)
1		J. Augereau, Y. Ousten, L. Béchou, Y. Danto: Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectronics Reliability 42(9-11): 1517-1522 (2002)

Coauthor Index

1	M. Aiche	[8]
2	F. Aniel	[7]
3	C. Armand	[10]
4	J. Augereau	[1]
5	Christelle Aupetit-Berthelemot	[3]
6	R. Baillot	[10]
7	G. Barreau	[8]
8	I. Bord	[8]
9	M. L. Bourqui	[9]
10	T. Buffeteau	[10]
11	Daniel T. Cassidy	[11]
12	Dominique Dallet	[6]
13	Yves Danto (Y. Danto)	[1] [2] [3] [4] [5] [6] [7]
14	Pasquale Daponte	[6]
15	J.-Y. Delétage	[4] [5]
16	A. Denolle	[7]
17	Y. Deshayes	[3] [4] [5] [7] [8] [9] [10]
18	Jean-Michel Dumas	[3]
19	Olivier Gilard	[9]
20	J. L. Goudard	[3] [5] [7]
21	Chadwick K. Hall	[11]
22	L. S. How	[9]
23	S. Huyghe	[7]
24	D. Laffitte	[3] [5] [7]
25	L. Mendizabal	[3]
26	P. H. Moretto	[8]
27	Y. Ousten (Yves Ousten)	[1] [2] [6] [8] [9] [10]
28	B. Parmentier	[2]
29	I. Pianet	[10]
30	B. Plano	[4]
31	Sergio Rapuano	[6]
32	Othman Rehioui	[11]
33	A. C. Roehrig	[8]
34	F. Rosala	[9]
35	S. Sorieul	[10]
36	André Touboul	[9]
37	B. Trégon	[2]
38	P. Del Vecchio	[9]
39	F. Verdier	[3] [5]
40	F. J.-M. Verdier	[4]
41	Jean-Louis Verneuil	[3]
42	F. Voillot	[10]
43	N. Zerounian	[7]

Colors in the list of coauthors

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