 | 2010 |
|---|
| 8 |       | Yassine Belmehdi,
Stephane Azzopardi,
Jean-Yves Deletage,
Eric Woirgard:
Experimental electro-mechanical static characterization of IGBT bare die under controlled temperature.
Microelectronics Reliability 50(9-11): 1815-1821 (2010) |
| 2009 |
|---|
| 7 | | A. Micol,
A. Zeanh,
T. Lhommeau,
Stephane Azzopardi,
E. Woirgard,
O. Dalverny,
M. Karama:
An investigation into the reliability of power modules considering baseplate solders thermal fatigue in aeronautical applications.
Microelectronics Reliability 49(9-11): 1370-1374 (2009) |
| 6 | | Yassine Belmehdi,
Stephane Azzopardi,
A. Benmansour,
J.-Y. Delétage,
Eric Woirgard:
Uni-axial mechanical stress effect on Trench Punch through IGBT under short-circuit operation.
Microelectronics Reliability 49(9-11): 1398-1403 (2009) |
| 2007 |
|---|
| 5 | | A. Benmansour,
Stephane Azzopardi,
J. C. Martin,
E. Woirgard:
Trench IGBT failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions.
Microelectronics Reliability 47(9-11): 1730-1734 (2007) |
| 4 | | A. Benmansour,
Stephane Azzopardi,
J. C. Martin,
E. Woirgard:
A step by step methodology to analyze the IGBT failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation.
Microelectronics Reliability 47(9-11): 1800-1805 (2007) |
| 2006 |
|---|
| 3 | | A. Benmansour,
Stephane Azzopardi,
J. C. Martin,
E. Woirgard:
Failure mechanism of trench IGBT under short-circuit after turn-off.
Microelectronics Reliability 46(9-11): 1778-1783 (2006) |
| 2005 |
|---|
| 2 | | Stephane Azzopardi,
A. Benmansour,
M. Ishiko,
E. Woirgard:
Assessment of the Trench IGBT reliability: low temperature experimental characterization.
Microelectronics Reliability 45(9-11): 1700-1705 (2005) |
| 2003 |
|---|
| 1 | | Stephane Azzopardi,
E. Woirgard,
J.-M. Vinassa,
O. Briat,
C. Zardini:
IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power?
Microelectronics Reliability 43(9-11): 1901-1906 (2003) |
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