Daisuke Azuma

	2005
1		Hideki Murakami, Yoshikazu Moriwaki, Masafumi Fujitake, Daisuke Azuma, Seiichiro Higashi, Seiichi Miyazaki: Characterization of Atom Diffusion in Polycrystalline Si/SiGe/Si Stacked Gate. IEICE Transactions 88-C(4): 646-650 (2005)

Coauthor Index

1	Masafumi Fujitake	[1]
2	Seiichiro Higashi	[1]
3	Seiichi Miyazaki	[1]
4	Yoshikazu Moriwaki	[1]
5	Hideki Murakami	[1]

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