 | 2011 |
| 11 |  | Y. Joly,
L. Truphemus,
Laurent Lopez,
Jean Michel Portal,
Hassen Aziza,
F. Julien,
Pascal Fornara:
Temperature and hump effect impact on output voltage spread of low power bandgap designed in the sub-threshold area.
ISCAS 2011: 2549-2552 |
| 10 |  | Fabrice Rigaud,
Jean Michel Portal,
Hassen Aziza,
Didier Née,
Julien Vast,
Fabrice Argoud,
Bertrand Borot:
Back-end soft and hard defect monitoring using a single test chip.
Microelectronics Reliability 51(6): 1136-1141 (2011) |
| 9 |  | Y. Joly,
Laurent Lopez,
Jean Michel Portal,
Hassen Aziza,
Jean-Luc Ogier,
Y. Bert,
F. Julien,
Pascal Fornara:
Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress.
Microelectronics Reliability 51(9-11): 1561-1563 (2011) |
| 2010 |
| 8 |  | Remi Pulicani,
Olivier Goducheau,
Hubert Degoirat,
Hassen Aziza,
Annie Pérez,
Emmanuel Bergeret:
Simulation of intrinsic bipolar transistor mechanisms for future capacitor-less eDRAM on bulk substrate.
ICECS 2010: 966-969 |
| 2009 |
| 7 |  | Olivier Ginez,
Jean Michel Portal,
Hassen Aziza:
An on-line testing scheme for repairing purposes in Flash memories.
DDECS 2009: 120-123 |
| 2008 |
| 6 |  | Olivier Ginez,
Jean Michel Portal,
Hassen Aziza:
A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories.
ITC 2008: 1-10 |
| 5 |  | Hassen Aziza,
Emmanuel Bergeret,
Jean Michel Portal,
Olivier Ginez:
A Novel Low Power Oriented Design Methodology for Analog Blocks.
J. Low Power Electronics 4(1): 60-67 (2008) |
| 2005 |
| 4 |  | Jean Michel Portal,
Hassen Aziza,
Didier Née:
EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement.
J. Electronic Testing 21(1): 33-42 (2005) |
| 2003 |
| 3 |  | Jean Michel Portal,
Hassen Aziza,
Didier Née:
EEPROM Memory: Threshold Voltage Built In Self Diagnosis.
ITC 2003: 23-28 |
| 2002 |
| 2 |  | Jean Michel Portal,
L. Forli,
Hassen Aziza,
Didier Née:
An Automated Methodology to Diagnose Geometric Defect in the EEPROM Cell.
ITC 2002: 31-36 |
| 1 |  | Jean Michel Portal,
L. Forli,
Hassen Aziza,
Didier Née:
An Automated Design Methodology for EEPROM Cell (ADE).
MTDT 2002: 137-142 |