Kaveh Azar

	2003
1		Yogendra Joshi, Kaveh Azar, David L. Blackburn, Clemens J. M. Lasance, Ravi Mahajan, Jukka Rantala: How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002. Microelectronics Journal 34(12): 1195-1201 (2003)

Coauthor Index

1	David L. Blackburn	[1]
2	Yogendra Joshi	[1]
3	Clemens J. M. Lasance	[1]
4	Ravi Mahajan	[1]
5	Jukka Rantala	[1]

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