K. Azamawari

	2001
1		A. Teramoto, H. Umeda, K. Azamawari, K. Kobayashi, K. Shiga, J. Komori, Y. Ohno, A. Shigetomi: Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. Microelectronics Reliability 41(1): 47-52 (2001)

Coauthor Index

1	K. Kobayashi	[1]
2	J. Komori	[1]
3	Y. Ohno	[1]
4	K. Shiga	[1]
5	A. Shigetomi	[1]
6	A. Teramoto	[1]
7	H. Umeda	[1]

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