Florence Azaïs

	2011
62		Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet: An electrical test method for MEMS convective accelerometers: Development and evaluation. DATE 2011: 806-811
61		Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir: A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources. J. Electronic Testing 27(3): 289-303 (2011)
60		Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell: Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electronic Testing 27(3): 335-350 (2011)
59		Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet: A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level. J. Electronic Testing 27(3): 411-423 (2011)
	2010
58		Nicolas Pous, Florence Azaïs, Laurent Latorre, Jochen Rivoir: On the use of standard digital ATE for the analysis of RF signals. European Test Symposium 2010: 43-48
57		Norbert Dumas, Florence Azaïs, Frédérick Mailly, Pascal Nouet: Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and Calibration. J. Electronic Testing 26(1): 111-125 (2010)
	2009
56		Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir: Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. Asian Test Symposium 2009: 261-266
55		Florence Azaïs, Yves Bertrand, Michel Renovell: An analysis of the timing behavior of CMOS digital blocks under Simultaneous Switching Noise conditions. DDECS 2009: 158-163
54		Jean-Robert Manouvrier, Pascal Fonteneau, Charles-Alexandre Legrand, Pascal Nouet, Florence Azaïs: Characterization of the transient behavior of gated/STI diodes and their associated BJT in the CDM time domain. Microelectronics Reliability 49(12): 1424-1432 (2009)
	2008
53		Norbert Dumas, Florence Azaïs, Frédérick Mailly, Andrew Richardson, Pascal Nouet: A novel method for test and calibration of capacitive accelerometers with a fully electrical setup. DDECS 2008: 304-309
52		Florence Azaïs, Laurent Larguier, Yves Bertrand, Michel Renovell: On the Detection of SSN-Induced Logic Errors through On-Chip Monitoring. IOLTS 2008: 233-238
51		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib: ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: (2008)
	2007
50		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2007: 211-216
49		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Computers & Digital Techniques 1(3): 146-153 (2007)
	2006
48		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. European Test Symposium 2006: 159-164
47		Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell: A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Design & Test of Computers 23(3): 234-243 (2006)
46		Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet: Electro-thermal Stimuli for MEMS Testing in FSBM Technology. J. Electronic Testing 22(2): 189-198 (2006)
45		Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet: Electro-thermal short pulsed simulation for SOI technology. Microelectronics Reliability 46(9-11): 1482-1485 (2006)
	2005
44		Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet: On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. VTS 2005: 213-218
43		Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell: Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS 2005: 389-394
42		Jean Marc Gallière, Michel Renovell, Florence Azaïs, Yves Bertrand: Delay Testing Viability of Gate Oxide Short Defects. J. Comput. Sci. Technol. 20(2): 195-200 (2005)
41		Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell: A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electronic Testing 21(1): 9-16 (2005)
40		Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell: Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electronic Testing 21(2): 135-146 (2005)
39		Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electronic Testing 21(3): 291-298 (2005)
38		Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell: Built-in self-test of global interconnects of field programmable analog arrays. Microelectronics Journal 36(12): 1112-1123 (2005)
37		Florence Azaïs, B. Caillard, S. Dournelle, P. Salomé, Pascal Nouet: A new multi-finger SCR-based structure for efficient on-chip ESD protection. Microelectronics Reliability 45(2): 233-243 (2005)
	2004
36		Antonio Zenteno, Víctor H. Champac, Michel Renovell, Florence Azaïs: Analysis and Attenuation Proposal in Ground Bounce. Asian Test Symposium 2004: 460-463
35		Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski: Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC 2004: 893-902
34		Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell: An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS 2004: 383-388
33		Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electronic Testing 20(3): 257-267 (2004)
32		Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electronic Testing 20(4): 375-387 (2004)
	2003
31		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand: Delay Testing of MOS Transistor with Gate Oxide Short. Asian Test Symposium 2003: 168-173
30		Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell: A New Methodology For ADC Test Flow Optimization. ITC 2003: 201-209
29		Florence Azaïs, Yves Bertrand, Michel Renovell, André Ivanov, Sassan Tabatabaei: An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs. IEEE Design & Test of Computers 20(1): 60-67 (2003)
28		Uros Kac, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell: Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test. IEEE Design & Test of Computers 20(2): 32-39 (2003)
27		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand: Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. J. Electronic Testing 19(4): 377-386 (2003)
26		Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell: On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. J. Electronic Testing 19(4): 469-479 (2003)
25		Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell: A-to-D converters static error detection from dynamic parameter measurement. Microelectronics Journal 34(10): 945-953 (2003)
	2002
24		Yves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival: European Network for Test Education. DELTA 2002: 230-234
23		Michel Renovell, Florence Azaïs, Yves Bertrand: Improving Defect Detection in Static-Voltage Testing. IEEE Design & Test of Computers 19(6): 83-89 (2002)
	2001
22		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: Implementation of a linear histogram BIST for ADCs. DATE 2001: 590-595
21		Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell: Analog BIST Generator for ADC Testing. DFT 2001: 338-346
20		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Serge Bernard, Yves Bertrand: Boolean and current detection of MOS transistor with gate oxide short. ITC 2001: 1039-1048
19		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: On-chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SOC 2001: 425-436
18		Florence Azaïs, Serge Bernard, Yves Bertrand, Xavier Michel, Michel Renovell: A Low-Cost Adaptive Ramp Generator for Analog BIST Applications. VTS 2001: 266-271
17		André Ivanov, Sumbal Rafiq, Michel Renovell, Florence Azaïs, Yves Bertrand: On the detectability of CMOS floating gate transistor faults. IEEE Trans. on CAD of Integrated Circuits and Systems 20(1): 116-128 (2001)
16		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs. J. Electronic Testing 17(2): 139-147 (2001)
15		Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell: Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. J. Electronic Testing 17(3-4): 255-266 (2001)
	2000
14		Luigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell: TI-BIST: a temperature independent analog BIST for switched-capacitor filters. Asian Test Symposium 2000: 78-83
13		Érika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski: Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. DATE 2000: 226-230
12		Michel Renovell, Florence Azaïs, Serge Bernard, Yves Bertrand: Hardware Resource Minimization for Histogram-Based ADC BIST. VTS 2000: 247-254
11		Michel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: Combining Functional and Structural Approaches for Switched-Current Circuit Testing. J. Electronic Testing 16(3): 259-267 (2000)
	1999
10		Michel Renovell, André Ivanov, Yves Bertrand, Florence Azaïs, Sumbal Rafiq: Optimal conditions for Boolean and current detection of floating gate faults. ITC 1999: 477-486
9		Yves Bertrand, Florence Azaïs, Marie-Lise Flottes, Regis Lorival: A Successful Distance-Learning Experience for IC Test Education. MSE 1999: 20-21
8		Michel Renovell, Florence Azaïs, Yves Bertrand: Detection of Defects Using Fault Model Oriented Test Sequences. J. Electronic Testing 14(1-2): 13-22 (1999)
	1998
7		Michel Renovell, Florence Azaïs, J-C. Bodin, Yves Bertrand: BISTing Switched-Current Circuits. Asian Test Symposium 1998: 372-377
6		Florence Azaïs, André Ivanov, Michel Renovell, Yves Bertrand: A Methodology and Design for Effective Testing of Voltage-Controlled Oscillators (VCOs. Asian Test Symposium 1998: 383-387
5		Michel Renovell, Florence Azaïs, Yves Bertrand: Optimized Implementations of the Multi-Configuration DFT Technique for Analog Circuits. DATE 1998: 815-821
4		Florence Azaïs, Michel Renovell, Yves Bertrand, J-C. Bodin: Design-For-Testability for Switched-Current Circuits. VTS 1998: 370-375
	1997
3		Michel Renovell, Florence Azaïs, Yves Bertrand: On-chip analog output response compaction. ED&TC 1997: 568-572
	1996
2		Michel Renovell, Florence Azaïs, Yves Bertrand: The multi-configuration: A DFT technique for analog circuits. VTS 1996: 54-59
	1995
1		Michel Renovell, Florence Azaïs, Yves Bertrand: A design-for-test technique for multistage analog circuits. Asian Test Symposium 1995: 113-119

Coauthor Index

1	Antonio Q. Andrade	[40]
2	Antonio Andrade Jr.	[34] [35] [38] [43]
3	Tiago R. Balen (Tiago Roberto Balen)	[34] [35] [38] [40] [43]
4	Serge Bernard	[12] [15] [16] [18] [19] [20] [21] [22] [24] [25] [26] [30] [32] [33] [39] [47] [48] [49] [50] [51] [60]
5	Yves Bertrand	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [29] [30] [31] [32] [33] [39] [42] [52] [55]
6	J-C. Bodin	[4] [7] [11]
7	B. Caillard	[37]
8	Luigi Carro	[13] [14]
9	Philippe Cauvet	[47] [48] [49] [50] [51] [60]
10	Omar Chakib	[51]
11	Víctor H. Champac (Víctor H. Champac Vilela)	[36]
12	Mariane Comte	[25] [30] [32] [33] [39] [47] [48] [49] [50] [51] [60]
13	Érika F. Cota	[13] [14]
14	S. Dournelle	[37]
15	Norbert Dumas	[44] [46] [53] [57] [59] [62]
16	Christophe Entringer	[45]
17	Philippe Flatresse	[45]
18	Marie-Lise Flottes	[9] [24]
19	Pascal Fonteneau	[54]
20	Jean Marc Gallière	[20] [27] [31] [42]
21	Philippe Galy	[45]
22	André Ivanov	[6] [10] [17] [29]
23	Uros Kac	[28]
24	Vincent Kerzerho	[47] [48] [49] [50] [51] [60]
25	Laurent Larguier	[52]
26	Laurent Latorre	[24] [44] [46] [56] [58] [61]
27	Charles-Alexandre Legrand	[54]
28	Regis Lorival	[9] [24]
29	Marcelo Lubaszewski	[13] [14] [34] [35] [38] [40] [41] [43]
30	Frédérick Mailly	[53] [57] [59] [62]
31	Jean-Robert Manouvrier	[54]
32	Xavier Michel	[18]
33	Pascal Nouet	[28] [37] [41] [44] [45] [46] [53] [54] [56] [57] [59] [62]
34	Franc Novak	[28]
35	Gustavo Pereira	[43]
36	Nicolas Pous	[56] [58] [61]
37	Sumbal Rafiq	[10] [17]
38	Ahmed Amine Rekik	[59] [62]
39	Michel Renovell	[1] [2] [3] [4] [5] [6] [7] [8] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [38] [39] [40] [41] [42] [43] [47] [48] [49] [50] [51] [52] [55] [60]
40	Andrew Richardson	[53]
41	Jochen Rivoir	[56] [58] [61]
42	P. Salomé	[37]
43	Sassan Tabatabaei	[29]
44	Gustavo Vieira	[38]
45	Antonio Zenteno	[36]

Last update Sun May 27 04:04:01 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page