 | 2011 |
|---|
| 9 |       | Alex Axelevitch,
B. Gorenstein,
Gady Golan:
Investigation of the electrical transport mechanism in VOx thin films.
Microelectronics Reliability 51(12): 2119-2123 (2011) |
| 2009 |
|---|
| 8 | | Alex Axelevitch,
Gady Golan:
Novel silicon high sensitive photonic sensor.
Microelectronics Journal 40(3): 435-438 (2009) |
| 2006 |
|---|
| 7 | | Gady Golan,
Alex Axelevitch,
B. Gorenstein:
Si-C multilayer quasi crystals preparation by DC magnetron sputtering.
Microelectronics Journal 37(12): 1538-1542 (2006) |
| 6 | | Gady Golan,
Alex Axelevitch:
Progress in vacuum photothermal processing (VPP).
Microelectronics Journal 37(5): 459-473 (2006) |
| 5 | | Gady Golan,
Alex Axelevitch,
B. Gorenstein,
V. Manevych:
Hot-Probe method for evaluation of impurities concentration in semiconductors.
Microelectronics Journal 37(9): 910-915 (2006) |
| 2003 |
|---|
| 4 | | Gady Golan,
Alex Axelevitch,
B. Sigalov,
B. Gorenstein:
Metal-insulator phase transition in vanadium oxides films.
Microelectronics Journal 34(4): 255-258 (2003) |
| 3 | | Gady Golan,
Alex Axelevitch,
B. Sigalov,
B. Gorenstein:
Integrated thin film heater-thermocouple systems.
Microelectronics Reliability 43(3): 509-512 (2003) |
| 2001 |
|---|
| 2 | | Gady Golan,
E. Rabinovich,
A. Inberg,
Alex Axelevitch,
G. Lubarsky,
P. G. Rancoita,
M. Demarchi,
A. Seidman,
N. Croitoru:
Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors.
Microelectronics Reliability 41(1): 67-72 (2001) |
| 1 | | Gady Golan,
Alex Axelevitch,
E. Rabinovitch:
Effects of electron beam generated in vacuum photo-thermal processing on metal-silicon contacts.
Microelectronics Reliability 41(6): 871-879 (2001) |
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