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| 1991 | ||
|---|---|---|
| 4 | Elisabeth Auth, Michael H. Schulz: A Test-Pattern-Generation Algorithm for Sequential Circuits. IEEE Design & Test of Computers 8(2): 72-86 (1991) | |
| 1989 | ||
| 3 | Michael H. Schulz, Elisabeth Auth: Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits. ITC 1989: 28-37 | |
| 2 | Michael H. Schulz, Elisabeth Auth: Improved deterministic test pattern generation with applications to redundancy identification. IEEE Trans. on CAD of Integrated Circuits and Systems 8(7): 811-816 (1989) | |
| 1988 | ||
| 1 | Michael H. Schulz, Elisabeth Auth: Advanced automatic test pattern generation and redundancy identification techniques. FTCS 1988: 30-35 | |
| 1 | Michael H. Schulz | [1] [2] [3] [4] |
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