 | 2011 |
|---|
| 5 |       | P. M. Dupuy,
P. Austin,
G. W. Delaney,
M. P. Schwarz:
Pore scale definition and computation from tomography data.
Computer Physics Communications 182(10): 2249-2258 (2011) |
| 2008 |
|---|
| 4 | | J. L. Fock-Sui-Too,
B. Chauchat,
P. Austin,
P. Tounsi,
Michel Mermet-Guyennet,
R. Meuret:
Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications.
Microelectronics Reliability 48(8-9): 1453-1458 (2008) |
| 2006 |
|---|
| 3 | | C. Caramel,
P. Austin,
J. L. Sanchez,
E. Imbernon,
M. Breil:
Integrated IGBT short-circuit protection structure: Design and optimization.
Microelectronics Journal 37(3): 249-256 (2006) |
| 2004 |
|---|
| 2 | | A. Bourennane,
M. Breil,
J. L. Sanchez,
P. Austin,
J. Jalade:
A new triggering mode in a vertical bi-directional MOS-thyristor device.
Microelectronics Journal 35(3): 277-285 (2004) |
| 1 | | G. Bonnet,
P. Austin,
J. L. Sanchez:
New distributed model of NPT IGBT dedicated to power circuits design.
Microelectronics Reliability 44(1): 79-88 (2004) |
Data released under the ODC-BY 1.0 license — See also our legal information page