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| 2009 | ||
|---|---|---|
| 1 | Yue Cui, Jesse S. Jin, Suhuai Luo, Mira Park, Sherlock S. L. Au: Automated Pattern Recognition and Defect Inspection System. ICIG 2009: 768-773 | |
| 1 | Yue Cui | [1] |
| 2 | Jesse S. Jin (Jesse Sheng Jin) | [1] |
| 3 | Suhuai Luo | [1] |
| 4 | Mira Park | [1] |
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