Robert W. Atherton

	1990
7		Robert W. Atherton, Linda F. Atherton, Mark Pool: Detailed simulation for semiconductor manufacturing. Winter Simulation Conference 1990: 659-663
	1986
6		Judith E. Dayhoff, Robert W. Atherton: Financial Impact of Tester Reliability Improvements. ITC 1986: 195-204
	1985
5		Judith E. Dayhoff, Robert W. Atherton: Financial Implications of a Detailed Analysis of Test Floor Operations. ITC 1985: 23-32
4		Robert W. Atherton, John L. Mudge: Microprocessor Speed Optimization Using Pattern-Recognition Analysis of Parametric Test Data. ITC 1985: 938-948
	1984
3		Robert W. Atherton, Leonard Ekkelkamp, Chuck Schmitz: Logic Device Characterization Using Computer-Aided Test and Analysis. ITC 1984: 367-383
	1983
2		Robert W. Atherton, David M. Campbell: Use of In-Fab Parametric Testing for Process Control of Semiconductor Manufacturing. ITC 1983: 238-247
1		Robert W. Atherton, Alfred H. Miller Jr., Judith E. Dayhoff: Operations Management and Analysis in the Management of Electronic Testing. ITC 1983: 418-427

Coauthor Index

1	Linda F. Atherton	[7]
2	David M. Campbell	[2]
3	Judith E. Dayhoff	[1] [5] [6]
4	Leonard Ekkelkamp	[3]
5	Alfred H. Miller Jr.	[1]
6	John L. Mudge	[4]
7	Mark Pool	[7]
8	Chuck Schmitz	[3]

Colors in the list of coauthors

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