Stephan P. Athan

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1996

1 Stephan P. Athan, David L. Landis, Sami A. Al-Arian: A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs. VTS 1996: 118-123

	1996
1		Stephan P. Athan, David L. Landis, Sami A. Al-Arian: A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs. VTS 1996: 118-123

Coauthor Index

1 Sami A. Al-Arian [1]

2 David L. Landis [1]

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