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Mansour H. Assaf Coauthor index pubzone.org

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DBLP keys2008
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSunil R. Das, Altaf Hossain, Satyendra Biswas, Emil M. Petriu, Mansour H. Assaf, Wen-Ben Jone, Mehmet Sahinoglu: On a New Graph Theory Approach to Designing Zero-Aliasing Space Compressors for Built-In Self-Testing. IEEE T. Instrumentation and Measurement 57(10): 2146-2168 (2008)
2007
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSunil R. Das, Jila Zakizadeh, Satyendra Biswas, Mansour H. Assaf, Amiya Nayak, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu: Testing Analog and Mixed-Signal Circuits With Built-In Hardware - A New Approach. IEEE T. Instrumentation and Measurement 56(3): 840-855 (2007)
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVoicu Groza, Rami S. Abielmona, Mansour H. Assaf, Mohammed Elbadri, Mohammad El-Kadri, Arkan Khalaf: A Self-Reconfigurable Platform for Built-In Self-Test Applications. IEEE T. Instrumentation and Measurement 56(4): 1307-1315 (2007)
2005
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu: Revisiting response compaction in space for full-scan circuits with nonexhaustive test sets using concept of sequence characterization. IEEE T. Instrumentation and Measurement 54(5): 1662-1677 (2005)
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu: Fault simulation and response compaction in full scan circuits using HOPE. IEEE T. Instrumentation and Measurement 54(6): 2310-2328 (2005)
2004
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMansour H. Assaf, Rami S. Abielmona, Payam Abolghasem, Sunil R. Das, Emil M. Petriu, Voicu Groza, Mehmet Sahinoglu: Implementation of Embedded Cores-Based Digital Devices in JBits Java Simulation Environment. CIT 2004: 315-325
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMansour H. Assaf, Sunil R. Das, Emil M. Petriu, Mehmet Sahinoglu: Enhancing Testability in Architectural Design for the New Generation of Core-Based Embedded Systems. HASE 2004: 312-313
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSunil R. Das, Chuan Jin, Liwu Jin, Mansour H. Assaf, Emil M. Petriu, Mehmet Sahinoglu: Altera Max Plus II Development Environment in Fault Simulation and Test Implementation of Embedded Cores-Based Sequential Circuits. IWDC 2004: 353-360
2003
5no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMansour H. Assaf, Rami S. Abielmona, Payam Abolghasem, Sunil R. Das, Emil M. Petriu, Voicu Groza: JBits Implementation and Design Verification in Space Compressor Design of Digital Circuits. Modelling, Identification and Control 2003: 415-420
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSunil R. Das, M. Sudarma, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Krishnendu Chakrabarty, Mehmet Sahinoglu: Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets. IEEE T. Instrumentation and Measurement 52(5): 1363-1380 (2003)
2002
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSunil R. Das, Mansour H. Assaf, Emil M. Petriu, Sujoy Mukherjee: Design of Aliasing Free Space Compressor in BIST with Maximal Compaction Ratio Using Concepts of Strong and Weak Compatibilities of Response Data Outputs and Generalized Sequence Mergeability. IWDC 2002: 234-245
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSunil R. Das, Jing Yi Liang, Emil M. Petriu, Mansour H. Assaf, Wen-Ben Jone, Krishnendu Chakrabarty: Data compression in space under generalized mergeability based on concepts of cover table and frequency ordering. IEEE T. Instrumentation and Measurement 51(1): 150-172 (2002)
2001
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone: Fault tolerance in systems design in VLSI using data compression under constraints of failure probabilities. IEEE T. Instrumentation and Measurement 50(6): 1725-1747 (2001)

Coauthor Index

1Rami S. Abielmona [5] [8] [11]
2Payam Abolghasem [5] [8]
3Satyendra Biswas [12] [13]
4Krishnendu Chakrabarty [2] [4]
5Sunil R. Das [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [12] [13]
6Mohammad El-Kadri [11]
7Mohammed Elbadri [11]
8Voicu Groza (Voicu Z. Groza) [5] [8] [11]
9Altaf Hossain [13]
10Chuan Jin [6]
11Liwu Jin [6]
12Wen-Ben Jone [1] [2] [4] [9] [10] [12] [13]
13Arkan Khalaf [11]
14Jing Yi Liang [2]
15Sujoy Mukherjee [3]
16Amiya Nayak (Amiya R. Nayak) [12]
17Emil M. Petriu [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [12] [13]
18C. V. Ramamoorthy (Chittoor V. Ramamoorthy) [1] [9] [10]
19Mehmet Sahinoglu [4] [6] [7] [8] [9] [10] [12] [13]
20M. Sudarma [4]
21Jila Zakizadeh [12]

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