Manuel J. Barragan Asian

	2012
13		Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez: Digital Adaptive Calibration of Multi-Step Analog to Digital Converters. J. Low Power Electronics 8(2): 182-196 (2012)
	2011
12		Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Leger, Adoración Rueda, José L. Huertas: Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs. Asian Test Symposium 2011: 359-364
11		Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Leger, Adoración Rueda, José L. Huertas: Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures. J. Electronic Testing 27(3): 277-288 (2011)
10		Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda: Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications. J. Electronic Testing 27(3): 305-320 (2011)
	2010
9		Manuel J. Barragan Asian, Gloria Huertas, Adoración Rueda, José Luis Huertas: (Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems. DELTA 2010: 8-13
8		Manuel J. Barragan Asian, Rafaella Fiorelli, Diego Vázquez, Adoración Rueda, José Luis Huertas: Low-cost signature test of RF blocks based on envelope response analysis. European Test Symposium 2010: 55-60
7		Antonio J. Ginés, Ricardo Doldán, Manuel J. Barragan Asian, Adoración Rueda, Eduardo J. Peralías: On-chip biased voltage-controlled oscillator with temperature compensation of the oscillation amplitude for robust I/Q generation. ISCAS 2010: 1979-1982
6		Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda: A BIST Solution for Frequency Domain Characterization of Analog Circuits. J. Electronic Testing 26(4): 429-441 (2010)
	2009
5		Manuel J. Barragan Asian, Rafaella Fiorelli, Diego Vázquez, Adoración Rueda, José Luis Huertas: A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis. Asian Test Symposium 2009: 255-260
	2008
4		Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda: Practical Implementation of a Network Analyzer for Analog BIST Applications. DATE 2008: 80-85
	2007
3		Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez: Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. DATE 2007: 1301-1306
	2006
2		Manuel J. Barragan Asian, Diego Vázquez, Adoración Rueda: A Sinewave Analyzer for Mixed-Signal BIST Applications in a 0.35µm Technology. DDECS 2006: 119-124
	2005
1		Diego Vázquez, Gloria Huertas, África Luque, Manuel J. Barragan Asian, Gildas Leger, Adoración Rueda, José Luis Huertas: Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST. J. Electronic Testing 21(3): 221-232 (2005)

Coauthor Index

1	Ricardo Doldán	[7]
2	Rafaella Fiorelli	[5] [8] [11] [12]
3	Antonio J. Ginés	[7]
4	José Pineda de Gyvez	[3] [13]
5	Gloria Huertas	[1] [9]
6	José Luis Huertas (José L. Huertas)	[1] [5] [8] [9] [11] [12]
7	Gildas Leger	[1] [11] [12]
8	África Luque	[1]
9	Eduardo J. Peralías	[7]
10	Adoración Rueda	[1] [2] [4] [5] [6] [7] [8] [9] [10] [11] [12]
11	Diego Vázquez	[1] [2] [4] [5] [6] [8] [10]
12	Amir Zjajo	[3] [13]

Colors in the list of coauthors

Last update Sat May 26 04:23:17 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page