 | 2008 |
|---|
| 4 |       | Masayuki Sato,
Hiroki Wakamatsu,
Masayuki Arai,
Kenichi Ichino,
Kazuhiko Iwasaki,
Takeshi Asakawa:
Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development.
JIPS 4(4): 121-132 (2008) |
| 2003 |
|---|
| 3 | | Takeshi Asakawa,
Kazuhiko Iwasaki,
Seiji Kajihara:
BIST-oriented test pattern generator for detection of transition faults.
Systems and Computers in Japan 34(3): 76-84 (2003) |
| 2001 |
|---|
| 2 | | Kenichi Ichino,
Takeshi Asakawa,
Satoshi Fukumoto,
Kazuhiko Iwasaki,
Seiji Kajihara:
Hybrid BIST Using Partially Rotational Scan.
Asian Test Symposium 2001: 379-384 |
| 1 | | Takeshi Asakawa,
Kazuhiko Iwasaki:
Using ATPG vectors for BIST test pattern generator.
Systems and Computers in Japan 32(11): 1-8 (2001) |
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