Klas Arvidsson

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2004

2 Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng: Efficient test solutions for core-based designs. IEEE Trans. on CAD of Integrated Circuits and Systems 23(5): 758-775 (2004)

2002

1 Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng: Integrated Test Scheduling, Test Parallelization and TAMDesign. Asian Test Symposium 2002: 397-404

	2004
2		Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng: Efficient test solutions for core-based designs. IEEE Trans. on CAD of Integrated Circuits and Systems 23(5): 758-775 (2004)
	2002
1		Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng: Integrated Test Scheduling, Test Parallelization and TAMDesign. Asian Test Symposium 2002: 397-404

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