 | 2011 |
| 9 |  | Daniel Arumí,
Rosa Rodríguez Montanes,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Gate Leakage Impact on Full Open Defects in Interconnect Lines.
IEEE Trans. VLSI Syst. 19(12): 2209-2220 (2011) |
| 8 |  | Daniel Arumí,
Rosa Rodríguez Montanes,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.
IEEE Trans. on CAD of Integrated Circuits and Systems 30(12): 1911-1922 (2011) |
| 2010 |
| 7 |  | Rosa Rodríguez-Montañés,
Daniel Arumí,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Diagnosis of full open defects in interconnect lines with fan-out.
European Test Symposium 2010: 233-238 |
| 2009 |
| 6 |  | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras:
Delay caused by resistive opens in interconnecting lines.
Integration 42(3): 286-293 (2009) |
| 2008 |
| 5 |  | Rosa Rodríguez-Montañés,
Daniel Arumí,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
ITC 2008: 1-10 |
| 4 |  | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman:
Full Open Defects in Nanometric CMOS.
VTS 2008: 119-124 |
| 3 |  | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras:
Experimental Characterization of CMOS Interconnect Open Defects.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 123-136 (2008) |
| 2007 |
| 2 |  | Daniel Arumí,
Rosa Rodríguez-Montañés,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
VTS 2007: 145-150 |
| 1 |  | Rosa Rodríguez-Montañés,
Daniel Arumí,
Joan Figueras,
Stefan Eichenberger,
Camelia Hora,
Bram Kruseman,
Maurice Lousberg,
Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines.
VTS 2007: 158-166 |