C. Armand

	2010
2		R. Baillot, Y. Deshayes, L. Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Y. Ousten: Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses. Microelectronics Reliability 50(9-11): 1568-1573 (2010)
	2001
1		Laurent Jalabert, Pierre Temple-Boyer, Gérard Sarrabayrouse, F. Cristiano, B. Colombeau, F. Voillot, C. Armand: Reduction of boron penetration through thin silicon oxide with a nitrogen doped silicon layer. Microelectronics Reliability 41(7): 981-985 (2001)

Coauthor Index

1	R. Baillot	[2]
2	L. Béchou (Laurent Béchou)	[2]
3	T. Buffeteau	[2]
4	B. Colombeau	[1]
5	F. Cristiano	[1]
6	Y. Deshayes	[2]
7	Laurent Jalabert	[1]
8	Y. Ousten (Yves Ousten)	[2]
9	I. Pianet	[2]
10	Gérard Sarrabayrouse	[1]
11	S. Sorieul	[2]
12	Pierre Temple-Boyer	[1]
13	F. Voillot	[1] [2]

Last update Sat May 26 04:23:17 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page