Davide Appello

	2011
27		Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi: Optimized embedded memory diagnosis. DDECS 2011: 347-352
	2010
26		Erik Jan Marinissen, Adit Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli: Adapting to adaptive testing. DATE 2010: 556-561
25		Davide Appello: Safety features of SoCs: How can they be re-used? DDECS 2010: 2
24		Nicola Campanelli, Tamas Kerekes, Paolo Bernardi, Mauricio de Carvalho, Alessandro Panariti, Matteo Sonza Reorda, Davide Appello, Mario Barone: Cumulative embedded memory failure bitmap display & analysis. DDECS 2010: 255-260
23		Paolo Rech, Michelangelo Grosso, Fabio Melchiori, D. Loparco, Davide Appello, Luigi Dilillo, Alessandro Paccagnella, Matteo Sonza Reorda: Analysis of root causes of alpha sensitivity variations on microprocessors manufactured using different cell layouts. IOLTS 2010: 29-34
	2009
22		Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda: Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. European Test Symposium 2009: 93-98
21		C. Guardiani, A. Shibkov, Angelo Brambilla, Giancarlo Storti Gajani, Davide Appello, F. Piazza, Paolo Bernardi: An I-IP based approach for the monitoring of NBTI effects in SoCs. IOLTS 2009: 15-20
20		Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello: Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS 2009: 69-74
19		Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda: DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281
18		Davide Appello, Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda: Effective Diagnostic Pattern Generation Strategy for Transition-Delay Faults in Full-Scan SOCs. IEEE Trans. VLSI Syst. 17(11): 1654-1659 (2009)
	2008
17		Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso: An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. European Test Symposium 2008: 140-145
16		Paolo Bernardi, Fabio Melchiori, Davide Pandini, Santo Pugliese, Davide Appello: Robust Design-for-Productization Practices for High Quality Automotive Products. ITC 2008: 1-9
	2007
15		Jorge Luis Lagos-Benites, Davide Appello, Paolo Bernardi, Michelangelo Grosso, Danilo Ravotto, Edgar E. Sánchez, Matteo Sonza Reorda: An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains. DFT 2007: 291-300
14		Davide Appello: Automotive IC's: less testing, more prevention. ITC 2007: 1-2
	2006
13		Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: Embedded Memory Diagnosis: An Industrial Workflow. ITC 2006: 1-9
12		Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda: On the Automation of the Test Flow of Complex SoCs. VTS 2006: 166-171
11		Davide Appello: Session Abstract. VTS 2006: 240-241
10		Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda: System-in-Package Testing: Problems and Solutions. IEEE Design & Test of Computers 23(3): 203-211 (2006)
	2004
9		Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre: Yield Analysis of Logic Circuits. VTS 2004: 103-108
8		Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew: Understanding Yield Losses in Logic Circuits. IEEE Design & Test of Computers 21(3): 208-215 (2004)
7		Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electronic Testing 20(1): 79-87 (2004)
	2003
6		Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante: Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC 2003: 379-385
	2002
5		Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW 2002: 206-210
4		Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello: High Accuracy Stimulus Generation for A/D Converter BIST. ITC 2002: 1031-1039
3		Davide Appello: The Yield of Test Outsourcing. ITC 2002: 1215
2		Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT 2002: 12-16
	2001
1		Davide Appello, Fulvio Corno, M. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda: A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis. Asian Test Symposium 2001: 97-102

Coauthor Index

1	Mario Barone	[24] [27]
2	Paolo Bernardi	[6] [7] [10] [12] [13] [15] [16] [17] [18] [19] [20] [21] [22] [24] [27]
3	Angelo Brambilla	[21]
4	Kenneth M. Butler	[26]
5	R. Cagliesi	[17] [22]
6	Nicola Campanelli	[24] [27]
7	John M. Carulli Jr.	[26]
8	Mauricio de Carvalho	[24] [27]
9	Fulvio Corno	[1] [2] [5] [7]
10	Luigi Dilillo	[23]
11	Marco Esposito	[26]
12	Alessandra Fudoli	[2] [4] [5] [6] [7] [8] [9]
13	Giancarlo Storti Gajani	[21]
14	Simone Gerardin	[19] [20]
15	M. Giancarlini	[17] [22]
16	Katia Giarda	[8] [9]
17	M. Giovinetto	[1]
18	Emil Gizdarski	[8] [9]
19	Dan Glotter	[26]
20	Michelangelo Grosso	[10] [12] [13] [15] [17] [18] [19] [20] [22] [23]
21	C. Guardiani	[21]
22	Tamas Kerekes	[24] [27]
23	Jorge Luis Lagos-Benites	[15]
24	D. Loparco	[23]
25	Erik Jan Marinissen	[26]
26	Ben Mathew	[8] [9]
27	Fabio Melchiori	[16] [23]
28	Amit Nahar	[26]
29	Alessandro Paccagnella	[19] [20] [23]
30	Alessandro Panariti	[24]
31	Davide Pandini	[16]
32	F. Piazza	[21]
33	Chris Portelli	[26]
34	Santo Pugliese	[16]
35	Danilo Ravotto	[15]
36	Maurizio Rebaudengo	[1] [2] [5] [6] [7] [12] [13]
37	Paolo Rech	[19] [20] [23]
38	Matteo Sonza Reorda	[1] [2] [5] [6] [7] [10] [12] [13] [15] [18] [19] [20] [22] [23] [24] [27]
39	Aubin Roy	[4]
40	Ernesto Sánchez (Edgar E. Sánchez, Edgar Ernesto Sánchez Sánchez)	[15] [18] [22]
41	A. Shibkov	[21]
42	Adit Singh	[26]
43	Stephen K. Sunter (Steve Sunter)	[4]
44	Vincenzo Tancorre	[2] [5] [6] [7] [8] [9] [12] [13] [27]
45	Marco Terzi	[27]
46	Massimo Violante	[6]

Colors in the list of coauthors

Last update Sat May 26 04:23:17 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page