H. Aono

	2005
1		H. Aono, E. Murakami, K. Okuyama, A. Nishida, M. Minami, Y. Ooji, K. Kubota: Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime. Microelectronics Reliability 45(7-8): 1109-1114 (2005)

Coauthor Index

1	K. Kubota	[1]
2	M. Minami	[1]
3	E. Murakami	[1]
4	A. Nishida	[1]
5	K. Okuyama	[1]
6	Y. Ooji	[1]

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