Benno Ankele

	2005
1		Christian Schlünder, Ralf Brederlow, Benno Ankele, Wolfgang Gustin, Karl Goser, Roland Thewes: Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits. Microelectronics Reliability 45(1): 39-46 (2005)

Coauthor Index

1	Ralf Brederlow	[1]
2	Karl Goser	[1]
3	Wolfgang Gustin	[1]
4	Christian Schlünder	[1]
5	Roland Thewes	[1]

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