E. San Andrés

	2011
2		P. C. Feijoo, M. Cho, M. Togo, E. San Andrés, G. Groeseneken: Positive bias temperature instabilities on sub-nanometer EOT FinFETs. Microelectronics Reliability 51(9-11): 1521-1524 (2011)
	2005
1		S. Dueñas, H. Castán, H. García, J. Barbolla, E. San Andrés, I. Mártil, G. González-Díaz: On the influence of substrate cleaning method and rapid thermal annealing conditions on the electrical characteristics of Al/SiNx/SiO2/Si fabricated by ECR-CVD. Microelectronics Reliability 45(5-6): 978-981 (2005)

Coauthor Index

1	J. Barbolla	[1]
2	H. Castán	[1]
3	M. Cho	[2]
4	S. Dueñas	[1]
5	P. C. Feijoo	[2]
6	H. García	[1]
7	G. González-Díaz	[1]
8	G. Groeseneken	[2]
9	I. Mártil	[1]
10	M. Togo	[2]

Colors in the list of coauthors

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