Enamul Amyeen

	2011
16		Enamul Amyeen, Andal Jayalakshmi, Srikanth Venkataraman, Sundar V. Pathy, Ewe C. Tan: Logic BIST silicon debug and volume diagnosis methodology. ITC 2011: 1-10
	2010
15		Dongok Kim, Irith Pomeranz, Enamul Amyeen, Srikanth Venkataraman: Defect diagnosis based on DFM guidelines. VTS 2010: 206-211
	2009
14		Enamul Amyeen, Srikanth Venkataraman, Mun Wai Mak: Microprocessor system failures debug and fault isolation methodology. ITC 2009: 1-10
	2007
13		Dongok Kim, Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau: Testing for systematic defects based on DFM guidelines. ITC 2007: 1-10
12		Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srikanth Venkataraman, Michael S. Hsiao, Kai Yang: Using Scan-Dump Values to Improve Functional-Diagnosis Methodology. VTS 2007: 231-238
	2006
11		Enamul Amyeen, Debashis Nayak, Srikanth Venkataraman: Improving Precision Using Mixed-level Fault Diagnosis. ITC 2006: 1-10
10		Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, Enamul Amyeen, Sudhakar M. Reddy: Dominance Based Analysis for Large Volume Production Fail Diagnosis. VTS 2006: 392-399
9		Ruifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman: Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS 2006: 66-71
	2004
8		Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee: Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC 2004: 669-678
7		Irith Pomeranz, Srikanth Venkataraman, Sudhakar M. Reddy, Enamul Amyeen: Defect Diagnosis Based on Pattern-Dependent Stuck-At Faults. VLSI Design 2004: 475-480
6		Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo: An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. VTS 2004: 23-30
	2003
5		Xiaoming Yu, Enamul Amyeen, Srikanth Venkataraman, Ruifeng Guo, Irith Pomeranz: Concurrent Execution of Diagnostic Fault Simulation and Equivalence Identification During Diagnostic Test Generation. VTS 2003: 351-358
4		Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana: Fault equivalence identification in combinational circuits using implication and evaluation techniques. IEEE Trans. on CAD of Integrated Circuits and Systems 22(7): 922-936 (2003)
	2002
3		Enamul Amyeen, Irith Pomeranz, W. Kent Fuchs: Theorems for Efficient Identification of Indistinguishable Fault Pairs in Synchronous Sequential Circuits. VTS 2002: 181-186
	2001
2		Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana: Fault Equivalence Identification Using Redundancy Information and Static and Dynamic Extraction. VTS 2001: 124-130
	1999
1		Enamul Amyeen, W. Kent Fuchs, Irith Pomeranz, Vamsi Boppana: Implication and Evaluation Techniques for Proving Fault Equivalence. VTS 1999: 201-213

Coauthor Index

1	Swagato Basumallick	[13]
2	Vamsi Boppana	[1] [2] [4]
3	W. Kent Fuchs	[1] [2] [3] [4]
4	Ruifeng Guo	[5] [6] [9] [12]
5	Michael S. Hsiao	[12]
6	Andal Jayalakshmi	[16]
7	Dongok Kim	[13] [15]
8	Berni Landau	[13]
9	Jinkyu Lee	[9]
10	Sangbong Lee	[6] [8]
11	Mun Wai Mak	[14]
12	Subhasish Mitra	[9]
13	Debashis Nayak	[11]
14	Ajay Ojha	[6] [8]
15	Sundar V. Pathy	[16]
16	Irith Pomeranz	[1] [2] [3] [4] [5] [7] [10] [13] [15]
17	Sudhakar M. Reddy	[7] [10]
18	Bharath Seshadri	[10]
19	Srihari Sivaraj	[6] [9]
20	Ewe C. Tan	[16]
21	Srikanth Venkataraman	[5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16]
22	Vishnu C. Vimjam	[12]
23	Kai Yang	[12]
24	Xiaoming Yu	[5]

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