Rashid Amine

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2005

2 José Pineda de Gyvez, Guido Gronthoud, Rashid Amine: Multi-VDD Testing for Analog Circuits. J. Electronic Testing 21(3): 311-322 (2005)

2003

1 José Pineda de Gyvez, Guido Gronthoud, Rashid Amine: VDD Ramp Testing for RF Circuits. ITC 2003: 651-658

	2005
2		José Pineda de Gyvez, Guido Gronthoud, Rashid Amine: Multi-VDD Testing for Analog Circuits. J. Electronic Testing 21(3): 311-322 (2005)
	2003
1		José Pineda de Gyvez, Guido Gronthoud, Rashid Amine: VDD Ramp Testing for RF Circuits. ITC 2003: 651-658

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