Atlaf Ul Amin

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2002

1 Atlaf Ul Amin, Satoshi Ohtake, Hideo Fujiwara: Design for Two-Pattern Testability of Controller-Data Path Circuits. Asian Test Symposium 2002: 73-79

	2002
1		Atlaf Ul Amin, Satoshi Ohtake, Hideo Fujiwara: Design for Two-Pattern Testability of Controller-Data Path Circuits. Asian Test Symposium 2002: 73-79

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