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Anthony P. Ambler Coauthor index pubzone.org

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23Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLftikhar Khan, Taikyeong T. Jeong, Gyung-Leen Park, Anthony P. Ambler: A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System. SNPD 2009: 3-7
2006
22Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTaikyeong T. Jeong, Anthony P. Ambler: Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System. ICCSA (5) 2006: 531-536
21Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLScott Davidson, Anthony P. Ambler, Helen Davidson: Behavioral Test Economics. ITC 2006: 1-9
2005
20Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLIl-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler: Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume. ISVLSI 2005: 194-199
19Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLIl-soo Lee, Yu-Ting Lin, Anthony P. Ambler: Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. ISVLSI 2005: 255-256
2002
18Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAnthony P. Ambler: Is It Rocket Science? ITC 2002: 1188-1189
17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDavid Williams, Anthony P. Ambler: System Manufacturing Test Cost Model. ITC 2002: 482-490
2001
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMichael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman: From DFT to systems test - a model based cost optimization tool. DATE 2001: 302-306
2000
15no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAnthony P. Ambler, Seraphin B. Calo, Gautam Kar: Services Management in Intelligent Networks, 11th IFIP/IEEE International Workshop on Distributed Systems: Operations and Management, DSOM 2000, Austin, Texas, USA, December 4-6, 2000, Proceedings Springer 2000
1997
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDes Farren, Anthony P. Ambler: The Economics of System-Level Testing. IEEE Design & Test of Computers 14(3): 51-58 (1997)
1995
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDes Farren, Anthony P. Ambler: Cost-Effective System-Level Test Strategies. ITC 1995: 807-813
1994
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDes Farren, Anthony P. Ambler: System Test Cost Modelling Based on Event Rate Analysis. ITC 1994: 84-92
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLI. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. Dick: Test strategy planning using economic analysis. J. Electronic Testing 5(2-3): 137-155 (1994)
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler: Sensitivity analysis in economics based test strategy planning. J. Electronic Testing 5(2-3): 239-251 (1994)
1993
9no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick: Economics in Design and Test. ICCD 1993: 384-387
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler: Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. ITC 1993: 210-217
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChryssa Dislis, J. H. Dick, Anthony P. Ambler: Algorithms for Cost Optimised Test Strategy Selection. ITC 1993: 383-391
1992
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlaa F. Alani, Gerry Musgrave, Anthony P. Ambler: A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. ITC 1992: 415-421
1991
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLI. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick: Economic Effects in Design and Test. IEEE Design & Test of Computers 8(4): 64-77 (1991)
1989
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler: Cost Analysis of Test Method Environments. ITC 1989: 875-883
1986
3no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear: Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC 1986: 232-243
1984
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. E. Glazier, Anthony P. Ambler: Ultimate: A hardware logic simulation engine. DAC 1984: 336-342
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPrab Varma, Anthony P. Ambler, Keith Baker: An Analysis of the Economics of Self Test. ITC 1984: 20-30

Coauthor Index

1Alaa F. Alani [6]
2I. N. Azu [8]
3Keith Baker [1]
4D. F. Burrows [3]
5Seraphin B. Calo [15]
6Helen Davidson [21]
7Scott Davidson [21]
8I. D. Dear [3] [4] [5] [8] [9] [11]
9J. Dick [11]
10J. H. Dick [5] [7] [8] [9] [10]
11Chryssa Dislis [4] [5] [7] [8] [9] [10] [11]
12Des Farren [12] [13] [14]
13M. E. Glazier [2]
14Jae-Hoon Jeong [20]
15Taikyeong T. Jeong (Taikyeong Jeong) [22] [23]
16Gautam Kar [15]
17Lftikhar Khan [23]
18W. L. Knight [3]
19S. C. Lau [4]
20Il-soo Lee [19] [20]
21Yu-Ting Lin [19]
22Christoph Maaß [16]
23J. R. Miles [4]
24Gerry Musgrave [6]
25Mark Paraskeva [3]
26Gyung-Leen Park [23]
27Mohammed Rahman [16]
28Erwin Trischler [10]
29Prab Varma [1]
30Michael G. Wahl [16]
31David Williams [17]

Colors in the list of coauthors

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