S. Altindal

	2011
6		S. Demirezen, S. Altindal, S. Özçelik, E. Özbay: On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods. Microelectronics Reliability 51(12): 2153-2162 (2011)
5		Z. Tekeli, M. Gökçen, S. Altindal, S. Özçelik, E. Özbay: On the profile of frequency dependent dielectric properties of (Ni/Au)/GaN/Al0.3Ga0.7N heterostructures. Microelectronics Reliability 51(3): 581-586 (2011)
	2010
4		Ilbilge Dökme, S. Altindal, T. Tunç, I. Uslu: Temperature dependent electrical and dielectric properties of Au/polyvinyl alcohol (Ni, Zn-doped)/n-Si Schottky diodes. Microelectronics Reliability 50(1): 39-44 (2010)
	2009
3		H. Altuntas, S. Altindal, H. Shtrikman, S. Özçelik: A detailed study of current-voltage characteristics in Au/SiO2/n-GaAs in wide temperature range. Microelectronics Reliability 49(8): 904-911 (2009)
	2004
2		N. Tugluoglu, S. Altindal, A. Tataroglu, S. Karadeniz: Dielectric properties in Au/SnO2/n-Si (MOS) structures irradiated under 60Co-gamma rays. Microelectronics Journal 35(9): 731-738 (2004)
	2003
1		A. Tataroglu, S. Altindal, S. Karadeniz, N. Tugluoglu: Au/SnO2/n-Si (MOS) structures response to radiation and frequency. Microelectronics Journal 34(11): 1043-1049 (2003)

Coauthor Index

1	H. Altuntas	[3]
2	S. Demirezen	[6]
3	Ilbilge Dökme	[4]
4	M. Gökçen	[5]
5	S. Karadeniz	[1] [2]
6	E. Özbay	[5] [6]
7	S. Özçelik	[3] [5] [6]
8	H. Shtrikman	[3]
9	A. Tataroglu	[1] [2]
10	Z. Tekeli	[5]
11	N. Tugluoglu	[1] [2]
12	T. Tunç	[4]
13	I. Uslu	[4]

Colors in the list of coauthors

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