 | 2012 |
| 18 |  | Louay Abdallah,
Haralampos-G. D. Stratigopoulos,
Salvador Mir,
Josep Altet:
Testing RF circuits with true non-intrusive built-in sensors.
DATE 2012: 1090-1095 |
| 2011 |
| 17 |  | Joan Mauricio,
Francesc Moll,
Josep Altet:
Monitor strategies for variability reduction considering correlation between power and timing variability.
SoCC 2011: 225-230 |
| 16 |  | Marvin Onabajo,
Josep Altet,
Eduardo Aldrete-Vidrio,
Diego Mateo,
José Silva-Martínez:
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor.
IEEE Trans. on Circuits and Systems 58-I(3): 458-469 (2011) |
| 15 |  | Marvin Onabajo,
Didac Gomez,
Eduardo Aldrete-Vidrio,
Josep Altet,
Diego Mateo,
José Silva-Martínez:
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations.
J. Electronic Testing 27(3): 225-240 (2011) |
| 2010 |
| 14 |  | Josep Altet,
Diego Mateo,
Eduardo Aldrete-Vidrio:
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits.
IOLTS 2010: 135 |
| 2009 |
| 13 |  | Eduardo Aldrete-Vidrio,
Marvin Onabajo,
Josep Altet,
Diego Mateo,
José Silva-Martínez:
Non-invasive RF built-in testing using on-chip temperature sensors.
ITC 2009: 1 |
| 2008 |
| 12 |  | Eduardo Aldrete-Vidrio,
M. Amine Salhi,
Josep Altet,
Stéphane Grauby,
Diego Mateo,
H. Michel,
L. Clerjaud,
Jean-Michel Rampnoux,
Antonio Rubio,
Wilfrid Claeys,
Stefan Dilhaire:
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.
European Test Symposium 2008: 47-52 |
| 2007 |
| 11 |  | Diego Mateo,
Josep Altet,
Eduardo Aldrete-Vidrio:
Electrical characterization of analogue and RF integrated circuits by thermal measurements.
Microelectronics Journal 38(2): 151-156 (2007) |
| 2006 |
| 10 |  | Josep Altet,
Diego Mateo,
J. L. González,
Eduardo Aldrete-Vidrio:
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements.
ISCAS 2006 |
| 2004 |
| 9 |  | Josep Altet,
Antonio Rubio,
M. Amine Salhi,
J. L. Gálvez,
Stefan Dilhaire,
Ashish Syal,
André Ivanov:
Sensing temperature in CMOS circuits for Thermal Testing.
VTS 2004: 179-184 |
| 8 |  | Josep Altet,
Jean-Michel Rampnoux,
Jean-Christophe Batsale,
Stefan Dilhaire,
Antonio Rubio,
Wilfrid Claeys,
Stéphane Grauby:
Applications of temperature phase measurements to IC testing.
Microelectronics Reliability 44(1): 95-103 (2004) |
| 2003 |
| 7 |  | Josep Altet,
André Ivanov,
A. Wong:
Thermal Testing of Analogue Integrated Circuits: A Case Study.
J. Electronic Testing 19(3): 353-357 (2003) |
| 2002 |
| 6 |  | Ashish Syal,
Victor Lee,
André Ivanov,
Josep Altet:
CMOS Differential and Absolute Thermal Sensors.
J. Electronic Testing 18(3): 295-304 (2002) |
| 2001 |
| 5 |  | Ashish Syal,
Victor Lee,
André Ivanov,
Josep Altet:
CMOS Differential and Absolute Thermal Sensors.
IOLTW 2001: 127- |
| 2000 |
| 4 |  | Josep Altet,
Antonio Rubio,
E. Schaub,
Stefan Dilhaire,
Wilfrid Claeys:
Thermal Testing: Fault Location Strategies.
VTS 2000: 189-194 |
| 1999 |
| 3 |  | Josep Altet,
Antonio Rubio,
Wilfrid Claeys,
Stefan Dilhaire,
E. Schaub,
Hideo Tamamoto:
Differential Thermal Testing: An Approach to its Feasibility.
J. Electronic Testing 14(1-2): 57-66 (1999) |
| 1997 |
| 2 |  | Josep Altet,
Antonio Rubio,
Hideo Tamamoto:
Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits.
Asian Test Symposium 1997: 149-154 |
| 1 |  | Josep Altet,
Antonio Rubio:
Differential Sensing Strategy for Dynamic Thermal Testing of ICs.
VTS 1997: 434-439 |