 | 2011 |
| 3 |  | Nadia Rezzak,
Michael L. Alles,
Ronald D. Schrimpf,
Sarah Kalemeris,
Lloyd W. Massengill,
John Sochacki,
Hugh J. Barnaby:
The sensitivity of radiation-induced leakage to STI topology and sidewall doping.
Microelectronics Reliability 51(5): 889-894 (2011) |
| 2008 |
| 2 |  | Alexander I. Fedoseyev,
Marek Turowski,
Ashok Raman,
Michael L. Alles,
Robert A. Weller:
Multiscale Numerical Models for Simulation of Radiation Events in Semiconductor Devices.
ICCS (2) 2008: 281-290 |
| 1 |  | Alexander I. Fedoseyev,
Marek Turowski,
Michael L. Alles,
Robert A. Weller:
Accurate numerical models for simulation of radiation events in nano-scale semiconductor devices.
Mathematics and Computers in Simulation 79(4): 1086-1095 (2008) |