Gerard A. Allan

	2000
7		Mike Moran, Gerard A. Allan: IC Critical Volume Calculation through Ray-Casting of CSG Trees. DFT 2000: 12-29
6		Gerard A. Allan: Yield prediction by sampling IC layout. IEEE Trans. on CAD of Integrated Circuits and Systems 19(3): 359-371 (2000)
	1999
5		Gerard A. Allan, Anthony J. Walton: Efficient extra material critical area algorithms. IEEE Trans. on CAD of Integrated Circuits and Systems 18(10): 1480-1486 (1999)
	1998
4		Gerard A. Allan: A Comparison of Efficient Dot Throwing and Shape Shifting Extra Material Critical Area Estimation. DFT 1998: 44-
	1997
3		Gerard A. Allan, Anthony J. Walton: Efficient critical area estimation for arbitrary defect shapes. DFT 1997: 20-28
	1994
2		Gerard A. Allan, Anthony J. Walton: Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. DFT 1994: 88-96
	1992
1		Gerard A. Allan, Anthony J. Walton, Robert J. Holwill: A yield improvement technique for IC layout using local design rules. IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1355-1362 (1992)

Coauthor Index

1	Robert J. Holwill	[1]
2	Mike Moran	[7]
3	Anthony J. Walton	[1] [2] [3] [5]

Colors in the list of coauthors

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