C. Ali

	2005
3		F. Sibileau, C. Ali, C. Giret, D. Faure: SRAM cell defect isolation methodology by sub micron probing technique. Microelectronics Reliability 45(9-11): 1562-1567 (2005)
	2003
2		D. Faure, D. Bru, C. Ali, C. Giret, K. Christensen: Gate oxide breakdown characterization on 0.13mum CMOS technology. Microelectronics Reliability 43(9-11): 1519-1523 (2003)
	2002
1		C. Giret, D. Bru, D. Faure, C. Ali, M. Razani, D. Gobled: Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis. Microelectronics Reliability 42(9-11): 1723-1727 (2002)

Coauthor Index

1	D. Bru	[1] [2]
2	K. Christensen	[2]
3	D. Faure	[1] [2] [3]
4	C. Giret	[1] [2] [3]
5	D. Gobled	[1]
6	M. Razani	[1]
7	F. Sibileau	[3]

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