 | 2011 |
|---|
| 9 |       | Dan Alexandrescu,
Enrico Costenaro,
Michael Nicolaidis:
A Practical Approach to Single Event Transients Analysis for Highly Complex Designs.
DFT 2011: 155-163 |
| 8 | | Dan Alexandrescu:
A comprehensive soft error analysis methodology for SoCs/ASICs memory instances.
IOLTS 2011: 175-176 |
| 7 | | Enrico Costenaro,
Massimo Violante,
Dan Alexandrescu:
A new IP core for fast error detection and fault tolerance in COTS-based solid state mass memories.
IOLTS 2011: 49-54 |
| 2010 |
|---|
| 6 | | Mehdi Baradaran Tahoori,
Ishwar Parulkar,
Dan Alexandrescu,
Kevin Granlund,
Allan Silburt,
Bapi Vinnakota:
Panel: Reliability of data centers: Hardware vs. software.
DATE 2010: 1620 |
| 2009 |
|---|
| 5 | | Dan Alexandrescu,
Anne-Lise Lhomme-Perrot,
Erwin Schäfer,
Cyrille Beltrando:
Highs and lows of radiation testing.
IOLTS 2009: 179 |
| 2008 |
|---|
| 4 | | Shi-Jie Wen,
Dan Alexandrescu,
Renaud Perez:
A Systematical Method of Quantifying SEU FIT.
IOLTS 2008: 109-114 |
| 3 | | Michael Nicolaidis,
Renaud Perez,
Dan Alexandrescu:
Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors.
VTS 2008: 371-376 |
| 2004 |
|---|
| 2 | | Dan Alexandrescu,
Lorena Anghel,
Michael Nicolaidis:
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation.
J. Electronic Testing 20(4): 413-421 (2004) |
| 2002 |
|---|
| 1 | | Dan Alexandrescu,
Lorena Anghel,
Michael Nicolaidis:
New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs.
DFT 2002: 99-107 |
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