 | 2011 |
|---|
| 7 |       | Marvin Onabajo,
Josep Altet,
Eduardo Aldrete-Vidrio,
Diego Mateo,
José Silva-Martínez:
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor.
IEEE Trans. on Circuits and Systems 58-I(3): 458-469 (2011) |
| 6 | | Marvin Onabajo,
Didac Gomez,
Eduardo Aldrete-Vidrio,
Josep Altet,
Diego Mateo,
José Silva-Martínez:
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations.
J. Electronic Testing 27(3): 225-240 (2011) |
| 2010 |
|---|
| 5 | | Josep Altet,
Diego Mateo,
Eduardo Aldrete-Vidrio:
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits.
IOLTS 2010: 135 |
| 2009 |
|---|
| 4 | | Eduardo Aldrete-Vidrio,
Marvin Onabajo,
Josep Altet,
Diego Mateo,
José Silva-Martínez:
Non-invasive RF built-in testing using on-chip temperature sensors.
ITC 2009: 1 |
| 2008 |
|---|
| 3 | | Eduardo Aldrete-Vidrio,
M. Amine Salhi,
Josep Altet,
Stéphane Grauby,
Diego Mateo,
H. Michel,
L. Clerjaud,
Jean-Michel Rampnoux,
Antonio Rubio,
Wilfrid Claeys,
Stefan Dilhaire:
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.
European Test Symposium 2008: 47-52 |
| 2007 |
|---|
| 2 | | Diego Mateo,
Josep Altet,
Eduardo Aldrete-Vidrio:
Electrical characterization of analogue and RF integrated circuits by thermal measurements.
Microelectronics Journal 38(2): 151-156 (2007) |
| 2006 |
|---|
| 1 | | Josep Altet,
Diego Mateo,
J. L. González,
Eduardo Aldrete-Vidrio:
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements.
ISCAS 2006 |
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