John F. Alder

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2007

1 Nicholas Bowring, John G. Baker, John F. Alder: Detection and Measurement of Thin Dielectric Layers Using Reflection of Frequency Scanned Millimetric Waves. ICNSC 2007: 437-442

	2007
1		Nicholas Bowring, John G. Baker, John F. Alder: Detection and Measurement of Thin Dielectric Layers Using Reflection of Frequency Scanned Millimetric Waves. ICNSC 2007: 437-442

Coauthor Index

1 John G. Baker [1]

2 Nicholas Bowring [1]

Last update Sat May 26 04:23:17 2012 CET by the DBLP Team —

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