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Muhammad Ashraful Alam Coauthor index pubzone.org

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DBLP keys2008
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMuhammad Ashraful Alam, Masud Hasan: Computing Nice Projections of Convex Polyhedra. WALCOM 2008: 111-119
2007
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKunhyuk Kang, Keejong Kim, Ahmad E. Islam, Muhammad Ashraful Alam, Kaushik Roy: Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement. DAC 2007: 358-363
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKunhyuk Kang, Sang Phill Park, Kaushik Roy, Muhammad Ashraful Alam: Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance. ICCAD 2007: 730-734
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKunhyuk Kang, Muhammad Ashraful Alam, Kaushik Roy: Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ. ITC 2007: 1-10
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKunhyuk Kang, Haldun Kufluoglu, Kaushik Roy, Muhammad Ashraful Alam: Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis. IEEE Trans. on CAD of Integrated Circuits and Systems 26(10): 1770-1781 (2007)
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy: Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 26(4): 743-751 (2007)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMuhammad Ashraful Alam, Haldun Kufluoglu, D. Varghese, S. Mahapatra: A comprehensive model for PMOS NBTI degradation: Recent progress. Microelectronics Reliability 47(6): 853-862 (2007)
2006
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBipul Chandra Paul, Kunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy: Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits. DATE 2006: 780-785
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKunhyuk Kang, Haldun Kufluoglu, Muhammad Ashraful Alam, Kaushik Roy: Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI. ICCD 2006
2005
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMuhammad Ashraful Alam, S. Mahapatra: A comprehensive model of PMOS NBTI degradation. Microelectronics Reliability 45(1): 71-81 (2005)
2004
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMuhammad Ashraful Alam: Software Security in Bangladesh with .NET Framework: A Roadmap. ITCC (2) 2004: 438-443

Coauthor Index

1Masud Hasan [11]
2Ahmad E. Islam [10]
3Kunhyuk Kang [3] [4] [6] [7] [8] [9] [10]
4Keejong Kim [10]
5Haldun Kufluoglu [3] [4] [5] [6] [7]
6S. Mahapatra [2] [5]
7Sang Phill Park [9]
8Bipul Chandra Paul (Bipul C. Paul) [4] [6]
9Kaushik Roy [3] [4] [6] [7] [8] [9] [10]
10D. Varghese [5]

Colors in the list of coauthors

Last update Sat May 26 04:23:17 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page