M. Alam

	2008
4		M. Alam: Reliability- and process-variation aware design of integrated circuits. Microelectronics Reliability 48(8-9): 1114-1122 (2008)
	2007
3		Michael T. Niemier, M. Alam, Xiaobo Sharon Hu, Gary H. Bernstein, Wolfgang Porod, M. Putney, J. DeAngelis: Clocking structures and power analysis for nanomagnet-based logic devices. ISLPED 2007: 26-31
	2005
2		Mohammed Y. Niamat, Surya S. Hejeebu, M. Alam: A BIST Approach for Testing FPGAs Using JBITS. FCCM 2005: 267-268
	2001
1		A. Ghetti, M. Alam, J. Bude: Anode hole generation mechanisms. Microelectronics Reliability 41(9-10): 1347-1354 (2001)

Coauthor Index

1	Gary H. Bernstein	[3]
2	J. Bude	[1]
3	J. DeAngelis	[3]
4	A. Ghetti	[1]
5	Surya S. Hejeebu	[2]
6	Xiaobo Sharon Hu (Xiaobo Hu)	[3]
7	Mohammed Y. Niamat	[2]
8	Michael T. Niemier	[3]
9	Wolfgang Porod	[3]
10	M. Putney	[3]

Colors in the list of coauthors

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