 | 2010 |
| 25 |  | Calvin Chiem,
Hussain Al-Asaad:
A Comparison of NMOS to PMOS Starved Buffer Implementations for the Delay Line in a PWM DC-DC Converters.
CDES 2010: 10-16 |
| 24 |  | Hussain Al-Asaad:
Time-Redundant Logic-Level Protection Mechanisms from Soft Errors in Digital Systems.
CDES 2010: 17-21 |
| 23 |  | Hussain Al-Asaad:
Efficient techniques for reducing error latency in on-line periodic built-in self-test.
IEEE Instrum. Meas. Mag. 13(4): 28-32 (2010) |
| 2009 |
| 22 |  | Hussain Al-Asaad:
Detection and Isolation of Faulty Processors in Multiprocessor Systems via TMR-Based Time Redundant Task Scheduling.
CDES 2009: 42-47 |
| 21 |  | Calvin Chiem,
Hussain Al-Asaad:
Low Power Methodologies and Challenges for PWM DC-DC Converters.
CDES 2009: 70-75 |
| 2008 |
| 20 |  | Jorge Campos,
Hussain Al-Asaad:
A Novel Mutation-Based Validation Paradigm for High-Level Hardware Descriptions.
IEEE Trans. VLSI Syst. 16(11): 1499-1512 (2008) |
| 2007 |
| 19 |  | Hussain Al-Asaad:
Efficient Global Fault Collapsing for Combinational Library Modules.
CDES 2007: 37-43 |
| 18 |  | Ahmed Sayed,
Hussain Al-Asaad:
A New Statistical Approach for Glitch Estimation in Combinational Circuits.
ISCAS 2007: 1641-1644 |
| 2006 |
| 17 |  | Ahmed Sayed,
Hussain Al-Asaad:
Survey and Evaluation of Low-Power Flip-Flops.
CDES 2006: 77-83 |
| 16 |  | Jorge Campos,
Hussain Al-Asaad:
Circuit Profiling Mechanisms for High-Level {ATPG}.
MTV 2006: 9-14 |
| 2005 |
| 15 |  | Hussain Al-Asaad,
Ganesh Valliappan,
Lourdes Ramirez:
A Novel Functional Testing and Verification Technique for Logic Circuits.
CDES 2005: 129-135 |
| 14 |  | Hector Arteaga,
Hussain Al-Asaad:
On Increasing the Observability of Modern Microprocessors.
CDES 2005: 91-96 |
| 13 |  | Hussain Al-Asaad:
EGFC: An exact global fault collapsing tool for combinational circuits.
Circuits, Signals, and Systems 2005: 56-61 |
| 12 |  | Jorge Campos,
Hussain Al-Asaad:
Search-Space Optimizations for High-Level ATPG.
MTV 2005: 84-89 |
| 2004 |
| 11 |  | Ahmed Sayed,
Hussain Al-Asaad:
Survey and Evaluation of Low-Power Full-Adder Cells.
ESA/VLSI 2004: 332-338 |
| 10 |  | Hector Arteaga,
Hussain Al-Asaad:
Approaches for Monitoring Vectors on Microprocessor Buses.
ESA/VLSI 2004: 393-398 |
| 2003 |
| 9 |  | Hussain Al-Asaad,
Alireza Sarvi:
Fault Tolerance for Multiprocessor Systems Via Time Redundant Task Scheduling.
VLSI 2003: 51-57 |
| 2000 |
| 8 |  | Hussain Al-Asaad,
John P. Hayes:
ESIM: A Multimodel Design Error and Fault Simulator for Logic Circuits.
VTS 2000: 221-230 |
| 7 |  | Hussain Al-Asaad,
John P. Hayes:
Logic Design Validation via Simulation and Automatic Test Pattern Generation.
J. Electronic Testing 16(6): 575-589 (2000) |
| 1998 |
| 6 |  | David Van Campenhout,
Hussain Al-Asaad,
John P. Hayes,
Trevor N. Mudge,
Richard B. Brown:
High-level design verification of microprocessors via error modeling.
ACM Trans. Design Autom. Electr. Syst. 3(4): 581-599 (1998) |
| 5 |  | Hussain Al-Asaad,
Brian T. Murray,
John P. Hayes:
Online BIST for Embedded Systems.
IEEE Design & Test of Computers 15(4): 17-24 (1998) |
| 4 |  | Hussain Al-Asaad,
John P. Hayes,
Brian T. Murray:
Scalable Test Generators for High-Speed Datapath Circuits.
J. Electronic Testing 12(1-2): 111-125 (1998) |
| 1995 |
| 3 |  | Hussain Al-Asaad,
John P. Hayes:
Design verification via simulation and automatic test pattern generation.
ICCAD 1995: 174-180 |
| 1994 |
| 2 |  | Hussain Al-Asaad,
Mankuan Michael Vai,
James Feldman:
Distributed Reconfiguration of Fault Tolerant VLSI Mulipipeline Arrays with Constant Interstage Path Lengths.
ICCD 1994: 75-78 |
| 1993 |
| 1 |  | Hussain Al-Asaad,
Elias S. Manolakos:
A Two-Phase Reconfiguration Strategy for Extracting Linear Arrays Out of Two-Dimensional Architectures.
DFT 1993: 56-63 |