Yasushi Akasaka

	2005
1		Takeo Matsuki, Kazuyoshi Torii, Takeshi Maeda, Yasushi Akasaka, Kiyoshi Hayashi, Naoki Kasai, Tsunetoshi Arikado: Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs. IEICE Transactions 88-C(5): 804-810 (2005)

Coauthor Index

1	Tsunetoshi Arikado	[1]
2	Kiyoshi Hayashi	[1]
3	Naoki Kasai	[1]
4	Takeshi Maeda	[1]
5	Takeo Matsuki	[1]
6	Kazuyoshi Torii	[1]

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