Takashi Aikyo

	2012
24		Yoshinobu Higami, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo: Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool. IEICE Transactions 95-D(4): 1093-1100 (2012)
	2011
23		Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing. IEICE Transactions 94-D(6): 1216-1226 (2011)
	2010
22		Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja: A Study of Capture-Safe Test Generation Flow for At-Speed Testing. IEICE Transactions 93-A(7): 1309-1318 (2010)
	2009
21		Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Hiroyuki Ueyama, Takashi Sato, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu: An Adaptive Test for Parametric Faults Based on Statistical Timing Information. Asian Test Symposium 2009: 151-156
20		Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara: A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. ICCAD 2009: 97-104
19		Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu: Diagnostic test generation for transition faults using a stuck-at ATPG tool. ITC 2009: 1-9
18		Koji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: A Novel Approach for Improving the Quality of Open Fault Diagnosis. VLSI Design 2009: 85-90
17		Hiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu: Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. VLSI Design 2009: 91-96
16		Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki, Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo: Small Delay Fault Model for Intra-Gate Resistive Open Defects. VTS 2009: 27-32
	2008
15		X. Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, H. Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja: A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. European Test Symposium 2008: 55-60
14		Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD 2008: 52-58
13		Yuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Koji Yamazaki: Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information. IEICE Transactions 91-D(3): 675-682 (2008)
12		Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Transactions 91-D(3): 726-735 (2008)
11		Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato: Post-BIST Fault Diagnosis for Multiple Faults. IEICE Transactions 91-D(3): 771-775 (2008)
	2007
10		Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu: Timing-Aware Diagnosis for Small Delay Defects. DFT 2007: 223-234
9		Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251
8		Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo: Estimation of delay test quality and its application to test generation. ICCAD 2007: 413-417
	2006
7		Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato: Effective Post-BIST Fault Diagnosis for Multiple Faults. DFT 2006: 401-109
6		Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression of 100x for Scan-Based BIST. ITC 2006: 1-10
	2000
5		Takashi Aikyo: Issues on SOC testing in DSM area: embedded tutorial. ASP-DAC 2000: 515-516
	1997
4		Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi: ATREX : Design for Testability System for Mega Gate LSIs. Asian Test Symposium 1997: 126-
3		Douglas Chang, Mike Tien-Chien Lee, Malgorzata Marek-Sadowska, Takashi Aikyo, Kwang-Ting Cheng: A Test Synthesis Approach to Reducing BALLAST DFT Overhead. DAC 1997: 466-471
	1990
2		Michiaki Emori, Takashi Aikyo, Yasuhide Machida, Jun-ichi Shikatani: ASIC CAD system based on hierarchical design-for-testability. ITC 1990: 404-409
	1986
1		Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii: An Automatic Test Generation System for Large Scale Gate Arrays. COMPCON 1986: 445-451

Coauthor Index

1	Tomoko Anan	[4]
2	Masayuki Arai	[6] [12] [16]
3	Douglas Chang	[3]
4	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[3]
5	Michiaki Emori	[2] [4] [6] [12]
6	S. Fujii	[1]
7	Satoshi Fukumoto	[6] [12]
8	Masayasu Fukunaga	[8]
9	Hiroshi Furukawa	[14] [15] [22] [23]
10	Masaki Hashizume	[9] [17] [18]
11	Y. Hatano	[1]
12	Kazumi Hatayama	[8] [14] [15] [16] [20] [21] [22] [23]
13	Yoshinobu Higami	[7] [9] [10] [11] [13] [17] [18] [19] [24]
14	Takahisa Hiraide	[6] [12]
15	J. Ishii	[1]
16	Koichi Itaya	[4]
17	H. Ito	[15]
18	Hideaki Ito	[14] [20] [22] [23]
19	Kazuhiko Iwasaki	[6] [12] [16]
20	Shuhei Kadoyama	[7] [11]
21	Seiji Kajihara	[8] [14] [15] [20] [22] [23]
22	N. Karasawa	[1]
23	Toru Kikkawa	[9]
24	Hideaki Konishi	[6] [12]
25	Junko Kumagai	[4]
26	Yosuke Kurose	[19]
27	Mike Tien-Chien Lee	[3]
28	Yasuhide Machida	[2]
29	Malgorzata Marek-Sadowska	[3]
30	Kazuya Masu	[21]
31	Tatsuru Matsuo	[6] [12]
32	Kohei Miyase	[14] [15] [20] [22] [23]
33	Shohei Morishima	[8]
34	Katsuyuki Nakano	[16]
35	Junichi Niimi	[4]
36	Kenji Noda	[14] [15] [20] [22] [23]
37	Satoshi Ohno	[19] [24]
38	Kyohei Ono	[10]
39	Junichi Ootsu	[10]
40	Kewal K. Saluja	[15] [22]
41	Takashi Sato	[21]
42	Yasuo Sato	[7] [11]
43	Jun-ichi Shikatani	[2]
44	Yoshihiro Shimizu	[19] [24]
45	Michihiro Shintani	[16] [21]
46	Akifumi Suto	[16]
47	Hiroshi Takahashi	[7] [9] [10] [11] [13] [17] [18] [19] [24]
48	Tomoyuki Takahashi	[21]
49	Yuzo Takamatsu	[7] [9] [10] [11] [13] [17] [18] [19]
50	Atsushi Takashima	[15] [22]
51	Toshiyuki Tsutsumi	[17] [18]
52	Hiroyuki Ueyama	[21]
53	Takumi Uezono	[21]
54	X. Wen	[15]
55	Xiaoqing Wen	[8] [14] [20] [22] [23]
56	Masahiro Yamamoto	[8]
57	Hironori Yamaoka	[19] [24]
58	Yuta Yamato	[14] [15] [20] [22] [23]
59	Koji Yamazaki	[7] [11] [13] [17] [18]
60	Hiroyuki Yotsuyanagi	[9] [17] [18]

Colors in the list of coauthors

Last update Sat May 26 04:23:17 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page